Ion-tofジャパン
WebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). ... ION-TOF USA, Inc. 100 Red Schoolhouse Road Building A8 Chestnut Ridge, NY 10977 Phone Fax Email (845) 352 - 8082 Webナノテクノロジープラットフォーム事業は令和3年度で終了し,新たに「マテリアル先端リサーチインフラ(ARIM)」事業に移行します.事業移行に伴い,本Webサイトは2月 …
Ion-tofジャパン
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Web29 sep. 2015 · Here we used time-of-flight secondary ion mass spectrometry (ToF-SIMS) to visualize the incorporation of three peptides with different hydrophobicities, bradykinin, Substance P, and vasopressin, into two classic MALDI matrices, 2,5-dihydroxybenzoic acid (DHB) and α-cyano-4-hydroxycinnamic acid (HCCA). Web3 nov. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atmospheric pressure matrix-assisted laser desorption/ionization (AP-MALDI) offer complementary capabilities. Here, we present a workflow to apply both techniques to a single tissue section and combine the resulting data for the example of human colon cancer tissue. Methods
Web7 apr. 2024 · Time-of-flight secondary ion mass spectrometry (ToF–SIMS) fragment analysis is an elaborate and challenging task. Among the analysis methods such as multivariate analysis and principal component ... Web21 dec. 2024 · IONTOFジャパン株式会社(イオントフジャパン)は、2024年設立の神奈川県横浜市緑区白山1丁目18番2号に所在する法人です(法人番号: 3010401161478)。. …
Web9 apr. 2024 · 未経験~ドイツ社のtof-simsを使った材料分析 2,280円~|派遣のお仕事を探すなら、2024オリコン顧客満足度調査 派遣情報サイト 第1位! のエン派遣。 未経験~ドイツ社のTOF-SIMSを使った材料分析の派遣の仕事情報|株式会社スタッフサービス・エンジニアリング(No.28281550) Web基本信息:设备名称:飞行时间二次离子质谱仪 Time-of-Flight Secondary Ion Mass Spectrometry, TOF-SIMS设备编号:13027664型号:TOF.SIMS 5厂家:ION-TOF …
Web飛行時間型二次イオン質量分析装置 (Time of flight secondary ion mass spectroscopy) 設置機関: 信州大学: 設置場所: 信州大学 長野(工学)キャンパス 国際科学イノベーション …
Web29 mrt. 2016 · ToF-SIMS spectra were obtained with a ToF-SIMS V (ION-TOF GmbH, Germany) equipped with a 25 keV Bi 3+ ion gun. For the ToF-SIMS spectrum, the ion gun was operated at 8.3 kHz with an average current of 0.28 pA (Bi 3+) at the sample holder. A bunch pulse of 0.7 ns duration resulted in mass resolution (M/ M) > 8000 at m/z 760. great hall projectWebion mass peaks and effects of dead time and ion interaction. Experimental All SIMS measurements were performed on a TOF.SIMS 5 instrument (ION-TOF, M¨unster, Germany) using 25 kV Bi x y+ primary ions. The 18O fractions were determined by operating the instrument in the novel “Collimated Burst Alignment” (CBA) great hall pgh paWebサイトの利用条件; 個人情報保護に関して © Hitachi High-Tech Science Corporation. 2003, 2024. All rights reserved. great hall priority raid shadow legendsWebION-TOF USA Nanotechnology Research Chestnut Ridge, NY 118 followers ToF-SIMS incl. our all new M6, Low Energy Ion Scattering, Hybrid SIMS, Full 3D characterization … great hall priestfieldhttp://siss-sims.com/seikei/SISS/SIMS7_160714/%ef%bc%93-5%20%e6%97%a5%e7%ab%8b%e3%83%8f%e3%82%a4%e3%83%86%e3%82%af%e3%82%b5%e3%82%a4%e3%82%a8%e3%83%b3%e3%82%b9%e3%80%80%e6%9c%80%e6%96%b0%e6%8a%80%e8%a1%93%e6%83%85%e5%a0%b1.pdf fll nearby airportsWeb30 mrt. 2024 · All experiments were performed with a TOF-SIMS V instrument (ION-TOF GmbH, Germany) equipped with a bismuth liquid metal ion source. The secondary ions were generated by the 25-keV Bi 3 + primary ion beam. In the experiments, a beam was set up to produce a beam current of approximately 0.1 pA with a beam size of approximately … fll nas flightsWebD-803i ION TRAP REFLECTRON POWER SUPPLY. Size (approximately), rack mounted. 19"W x 5.25"H x 14.5"D. Input voltage (power requirements) 100/120/220/240, 50/60 Hz. … great hall project dia